2D TRANSFER SYSTEM
EXFOLIATE AND DRY TRANSFER 2D MATERIALS DETERMINISTICALLY
The deterministic dry transfer system for Graphene, TMDC, hBN etc. allows for the placement of 2D materials onto a user defined specific location with an unprecedented degree of accuracy and reliability. Easy Placement inside glove boxes. Fabrication of devices with rather complex architectures including assembling artificial stacks of dissimilar 2D materials to build-up van der Waals heterostructures.
The Manual transfer system contain all the required elements such as Optical zoom microscope with high numerical aperture and Long Working distance objectives as well as highly accurate crossed roller bearing stages for fabrication of a high quality 2D heterostructures and also twisted graphene.
System Includes:
-
Placement of 2D materials with an unprecedented degree of accuracy and reliability.
-
Easy to use compact Plug and Play system. Start straight way after installation
-
State of the art vision system with epi-illumination for gold/metal marker identification
-
High accuracy mechanical manipulation stages with sample heating.
2 TESLA ELECTROMAGNET
2T VARIABLE GAP C-FRAME DIPOLE electroMAGNET
- WATER COOLED COILS
Model EMC2T is a compact variable Gap Cframe dipole Electromagnet manufactured using cutting edge of magnet technology. It is ideal for small scale laboratory‐based, wide range of experiments like Hall/ Spin Hall Effect Measurements, Magnetic susceptibility & Hysteresis Studies Magneto‐transport, MagnetoOptical Studies etc.
Used in low temperature research/industrial applications where a large pole gap and coil spacing is required for the sample or ancillary equipment such as a Cryostat. Useful for Susceptibility, Hall, Magneto-optical, Magneto-transport, Spin Resonance, EPR, MOKE etc. experiments
PROBE STATION
ELECTRICAL PROBING FOR NANOELECTRONICS
PSM 100 probe station is an economical manual probe station for probing up to 100 mm (4") wafers for a host of non-destructive standard electrical device measurement. It has high-performance solutions wafer level probe capability to the test board level to assist with post tape-out product testing for circuit boards and modules, semiconductor 2D devices/films, MEMS, electro-optic devices and more.
The Probe station is available with accessories such as special cables, calibration software, and industry-leading probes that help you position, calibrate, and characterize your device under test
-
Optimised for I-V, C-V measurements of device and wafer characterization tests, failure analysis, sub-micron probing, MEMS, optoelectronic engineering tests and more
-
Stable platen mounted with up to 6 micropositioners.
-
Solid station frame with Built-in vibration-isolations
-
Option of High resolution top side microscope
-
Quick and ergonomic sample change
-
Electrical Measurement Breakout Box with BNC breakout, suitable for measurements using Parameter Analyzers or Sourcemeters, Multimeters etc.
VOLTAGE SOURCES
LOW NOISE GATING AND BIASING ISOLATED VOLTAGE SOURCES
The Model CN902IS isolated voltage sources from CRYONANO provides 4 precise and stable isolated DC voltages up to ± 10V for biasing purposes and ability to stack channels to get an output of ± 40V. Each output provides an independent signal path, enabling you to update all four channels simultaneously. Unlike DC power supplies, the outputs currents are limited to small values, and the outputs are optimized for high short and long term stability, low noise and low temperature drift.
User control of the device can be accomplished by Labview programs [Drivers provided], utilizing a standard USB connection (USB 2.0 compatible). Each channel has a digital-to-analog converter (DAC) that produces a voltage signal. Each channel also features ±30 V overvoltage protection; short-circuit protection, low crosstalk, fast slew rate, high relative accuracy.