CRYONANO

ELECTRICAL PROBING FOR NANOELECTRONICS

​

PSM 100 probe station is an economical manual probe station for probing up to 100 mm (4") wafers for a host of non-destructive standard electrical device measurement. It has high-performance solutions wafer level probe capability to the test board level to assist with post tape-out product testing for circuit boards and modules, semiconductor 2D devices/films, MEMS, electro-optic devices and more.

 

The Probe station is available with accessories such as special cables, calibration software, and industry-leading probes that help you position, calibrate, and characterize your device under test

​

• Optimised for I-V, C-V measurements of device and wafer characterization tests, failure analysis, sub-micron probing, MEMS, optoelectronic engineering tests and more

• Stable platen mounted with up to 6 micropositioners.

• Solid station frame with Built-in vibration-isolations

• Option of High resolution top side microscope

• Quick and ergonomic sample change

• Electrical Measurement  Breakout  Box  with  BNC  breakout,  suitable  for measurements using Parameter Analyzers or Sourcemeters, Multimeters etc.