The PSM 100 is designed for seamless integration with industry-standard electrical test equipment, allowing laboratories to incorporate it into existing setups without complex reconfiguration. It supports comprehensive electrical characterization workflows, including I–V and C–V device measurements, wafer-level probing and parametric testing, detailed electrical failure analysis, and testing of MEMS as well as electro-optic devices. This broad measurement capability makes it suitable for both research and advanced device development environments.

An integrated Electrical Measurement Breakout Box equipped with BNC connectors enables direct and reliable connection to parameter analyzers, source-measure units (SMUs), multimeters, and LCR meters. This flexible interface architecture ensures efficient signal routing, stable data acquisition, and streamlined test configuration, ultimately enhancing productivity and measurement accuracy across a wide range of semiconductor and microsystem applications.